
Much of the PVD research at IPML has been motivated by industry's need to improve its material synthesis abilities either through the development of new processing technology or through the improvement of its current technologies based upon accurate, insightful computer simulations of its processing systems. The most important application-driven PVD research conducted by IPML researchers to date is described below:
Giant Magneto Resistance Materials
Continuous Fiber Reinforced Metal Matrix Composites
Polysilicon deposition for Thin Film Transistors
Thermal Barrier Coatings (TBCs)
Giant Magneto Resistance (GMR) Materials
Continuous Fiber Reinforced (CFR) Metal Matrix Composites (MMCs)
The primary motivating material system behind development of the University of
Virginia's Directed Vapor Deposition (DVD) technology has been the coating of
continuous fibers to be used as reinforcement in metal matrix composites.
High temperature light weight load bearing aerospace structures
such as compressor fan blades for the front section of aircraft engines represent
one of the primary areas of application for these difficult to synthesize materials.
While companies such as 3M and GE Aircraft Engines have employed techniques such
as conventional e-beam evaporation and plasma spraying to create CFR MMCs, each of
these methods has drawbacks. Conventional e-beam evaporation suffers from low materials
utilization efficiency, with significant quantities of the expensive metal matrix material
ending up on the walls of the processing chamber instead of the fibers. To capture as much
vapor as possible during its conventional e-beam processing, 3M uses intricate fiber
manipulation systems. These fiber manipulation systems frequently break fibers,
forcing the coating run to be terminated. Plasma spray technology creates a rough surfaced,
fiber containing plasma spray foil. During the hot isostatic pressing cycle which presses
these layers together, significant fiber fracture often degrades the properties of the
resulting material.
To explore the ability of DVD to create smoothly coated fibers efficiently, an
array of 142 mm diameter SCS-6 fibers (supplied by Textron
Specialty Materials, Lowell, MA) was set up in a square aluminum frame with an inside
edge dimension of 5.08 cm. 25 colinear fibers were mounted vertically with a nominal
center-to-center fiber spacing of 2 mm. During each run, the fiber frame itself was
covered with aluminum foil to ensure that metal deposition on it was not included
in the weight change measurements. For the fiber spacing used, 7.1% of the
cross-sectional area of the frame interior was occupied by fibers. Thus, if a
uniform flux were incident upon the fibers and deposition occurred only on surfaces
that were insight of the flux, the average deposition efficiency
(i.e. the efficiency achieved in a conventional e-beam system) would be 7.1%.
As with flat substrate coating, low chamber pressures (low carrier gas fluxes) did not
entrain the vapor and transport it towards the fiber array, resulting in low
deposition efficiencies. Instead, the main vapor stream crossed the primary carrier
gas flow and passed between the e-beam gun and the top of the fiber array. Once the
carrier gas flow was increased so that the vapor passed through the frame, deposition
efficiencies increased dramatically. Increasing carrier gas flows led to a peak in
deposition efficiency (at about 70 Pa) followed by a significant decrease as
chamber pressure was raised. This trend suggests that the presence of the observed
microwall jet (See the next figure below.)
results in vapor atom redirection around the fibers. At pressures near 70 Pa this
redirection led to coating around the entire fiber circumference. At higher pressures
the microwall jet prevented vapor atoms from reaching the fiber surface, leading to
decreased deposition efficiency in much the same manner as the larger wall shock
and wall jet deflected vapor away from flat substrates.
The fiber coating experiments revealed a peak deposition efficiency over twice the
7.1% expected for line-of-sight deposition. Scanning electron microscopy
(See the following figure.)
of these samples revealed that, for conditions of maximum efficiency, vapor
deposited not only on the surface of the fiber facing the incoming vapor but
also on the fiber's sides and its back. The backside fiber coating phenomenon
appeared to be a manifestation of atomic scattering from the flow as it passes
the fiber, a phenomenon discussed previously by Hill. A
demonstration
program
created by G.A. Bird helps illustrate how backside fiber coating occurs.
Based upon the fiber coating results presented above, DVD appears to have some
promise as a fiber coating system since under certain process conditions the
system presents a narrow region through which rotated fibers can be passed for
uniform, high rate (50 - 100 mm/min.), high
efficiency vapor deposition. These results suggest that it may be possible to
accomplish industrially acceptable high rate fiber coating using a fairly small,
low-cost e-beam gun system, perhaps even a system the size of the experimental
setup developed at the University of Virginia.
To assess more fully the ability of DVD to coat fibers in an industrial setting,
research should be conducted which will demonstrate the technology's ability to
deposit the correct alloy compositions desired for the metal matrix composite
fiber application (e.g., Ti-6Al-4V). Single crucible evaporation of this alloy
system using DVD will almost certainly experience the same stoichiometry problems
observed with conventional e-beam systems. However, use of two in-line vapor
targets and the gas jet could quite conceivably overcome this troublesome problem
by mixing the two vapor plumes for efficient, compositionally correct deposition
(See the next figure below.). Incorporation of a high rate scanning system into
the current DVD configuration would allow the beam power to be precisely split
between the two targets for stoichiometrically-correct evaporation. Additional
research will need to be conducted to investigate the deposition rate around
fibers for different elements. It should be noted that the non-line-of-sight
coating efficiency of low vacuum systems is a function of the mass of the chamber
gas and the vapor atoms. No data currently exists which explains how to obtain a
stoichiometrically-correct, industrially-desirable Ti-6-4 deposit in a DVD system.
As a result DVD research at the University of Virginia will probably need to
demonstrate that the technology can create a large quantity of
stoichiometrically-correct clean coating on fibers during a single processing
run before industry will seriously consider the technology a viable alternative.
To reach this level of processing reliability, the lifetime of the e-beam gun's
filament must be extended from the current ten hour limit. In an industrial
setting, a tungsten filament lifetime of 100 - 250 hours will almost certainly
be required.
Polycrystalline silicon (polysilicon) for Thin Film Transistors (TFTs)
The ability of DVD technology to deposit useful amorphous and polycrystalline
silicon for thin film transistor (TFT) applications has been investigated.
Silicon was evaporated and deposited upon glass substrates at different substrate
temperatures. The morphological and crystalline characteristics of the deposited
films were then studied via scanning electron microscopy and optical transmission
and reflection techniques. For these experiments, a 1.27 cm diameter
phosphorous-doped (0.1 W-cm) single-crystal silicon
rod contained within a water-cooled crucible was used as the evaporation target,
and the carrier gas jet consisting of helium with a 5% argon content. For each
10 minute deposition run, a gas jet pressure ratio (mixing chamber/processing
chamber) of ~22 was generated using a 0.85 cm diameter nozzle and a chamber
pressure of 0.14 Torr (~20 Pa). The selection of the substrate temperature
range for the experiments considered the following:
For many of the experimental conditions investigated, deposition efficiencies were
well above line-of-sight levels (i.e. the area fraction occupied by fibers).
At the point of intersection between the vapor-laden carrier gas stream and the
array of fibers, a wall shock is observed, demonstrating how the presence of the
fibers affects the flowfield.
Vapor deposition was evident upon the sides (~15 mm
thick) and back (~5 mm thick) of this fiber held
stationary during the deposition process (M = 1.50, chamber pressure = 66.7 Pa).
Stoichiometrically-correct deposition using this DVD system configuration could
be much faster and more efficient than that achieved in a conventional
multicrucible e-beam evaporation system.
Only mixed material in region (AB) can create a compositionally correct alloy.
Substrate temperatures were generally held at 325°C or higher to reduce the argon content in the films (4) while the maximum substrate temperature examined (550°C) was less than the critical temperature of the glass substrates. For the various d
eposition runs, the e-beam power was set between 300 and 600 W. Prior to silicon deposition, an inert gas flow was used to remove any particulates from the substrate surface.
| Substrate Temperature (oC) | E-beam Power (W) | Resulting Microstructure |
|---|---|---|
|
|
|
Amorphous. Generally smooth morphology, repeated domed regions ~0.35 mm in diameter, no clear separation between adjoining domes. Film cracking evident. Optical appearance = grey. |
|
|
|
Amorphous. Distinct columns ~0.25 mm in diameter, clear void spaces between columns, rough surface morphology. Optical appearance = grey. |
|
|
|
Amorphous. Distinct columns ~0.25 mm in diameter, clear void spaces between columns, rough surface morphology. Optical appearance = grey. |
|
|
|
Amorphous. Distinct columns ~0.25 mm in diameter, clear void spaces between columns, rough surface morphology. Optical appearance = grey. |
|
|
|
Polycrystalline. Larger diameter columns ~0.33-0.50 mm in diameter, less obvious separation, continued rough surface morphology. Optical appearance = silver. |
|
|
|
Polycrystalline. Larger diameter columns ~0.33-0.50 mm in diameter, less obvious separation, continued rough surface morphology. Optical appearance = silver. |
| 1 Condensation of the silicon vapor increased the substrate temperature from room temperature to 70oC. | ||
| 2 Deposition rate for this experiment exceeded the deposition rate used in other experiments. | ||
The figures below show scanning electron micrographs of silicon films deposited at 475oC and 515oC respectively. The amorphous film shown in the first figure has small, tightly-packed columns approximately 0.25 mm in diameter which give rise to a rough surface morphology. In contrast, the polycrystalline silicon film deposited at 515°C shown in the second figure has larger, loosely-packed columns approximately 0.33-0.50 mm in diameter which give rise to a rough, porous morphology. It is interesting to note that the transition from amorphous to polycrystalline microstructure has been reported to occur at temperatures around 580°C for traditional low pressure chemical vapo r deposition processes, in contrast to the transition observed here in the range of 475 - 515oC .
A general examination of all of the films revealed two major transitions in the film microstructure. The first occurred between 70°C and 325°C. While the films at these two temperature are both amorphous, examination of the top surfaces of the f ilms revealed a morphology change, from a smooth continuous surface at 70°C to a rough surface consisting of tightly packed columns at 325°C. The second morphology transition occurred between 475°C and 515°C. In this instance, the chan ge in morphology from distinct columns with clear intercolumnar porosity to larger diameter columns with less obvious separation was accompanied by a change from amorphous to polycrystalline silicon.
While these experiments demonstrate that DVD technology can produce polycrystalline silicon films in a single step, low temperature process that is compatible with glass substrates, the morphology of the current films (i.e., not a smooth polycrystalline f ilm) precludes their use in thin film transistor applications and further work must now identify the process conditions which produce smooth polycrystalline films needed for many electronic material applications.
|
|
|
| Porous structure consisting of amorphous columns separated by voids. (T = 475oC, Beam power = 420 W) | Porous structure composed of polycrystalline columns separated by voids. (T = 515oC, Beam power = 420 W) |